Abstract
The investigation of high-density surface-mount devices has been made easier with new techniques and equipment that allow an individual to correlate findings from one instrument to another; from optical to X-ray and CT to SEM. Add to that improved ease of use and automation and the individual can focus on being an investigator rather than an instrument or process specialist.
| Original language | English |
|---|---|
| Pages (from-to) | 88-92 |
| Number of pages | 5 |
| Journal | SMT Surface Mount Technology Magazine |
| Volume | 27 |
| Issue number | 3 |
| State | Published - Mar 2012 |