Big, Deep, and Smart Data in Scanning Probe Microscopy

Sergei V. Kalinin; Evgheni Strelcov; Alex Belianinov; Suhas Somnath; Rama K. Vasudevan; Eric J. Lingerfelt; Richard K. Archibald; Chaomei Chen; Roger Proksch; Nouamane Laanait; Stephen Jesse

doi:10.1021/acsnano.6b04212

Big, Deep, and Smart Data in Scanning Probe Microscopy

Sergei V. Kalinin, Evgheni Strelcov, Alex Belianinov, Suhas Somnath, Rama K. Vasudevan, Eric J. Lingerfelt, Richard K. Archibald, Chaomei Chen, Roger Proksch, Nouamane Laanait, Stephen Jesse

Research output: Contribution to journal › Article › peer-review

99 Scopus citations

Abstract

Scanning probe microscopy (SPM) techniques have opened the door to nanoscience and nanotechnology by enabling imaging and manipulation of the structure and functionality of matter at nanometer and atomic scales. Here, we analyze the scientific discovery process in SPM by following the information flow from the tip-surface junction, to knowledge adoption by the wider scientific community. We further discuss the challenges and opportunities offered by merging SPM with advanced data mining, visual analytics, and knowledge discovery technologies.

Original language	English
Pages (from-to)	9068-9086
Number of pages	19
Journal	ACS Nano
Volume	10
Issue number	10
DOIs	https://doi.org/10.1021/acsnano.6b04212
State	Published - Oct 25 2016
Externally published	Yes

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10.1021/acsnano.6b04212

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title = "Big, Deep, and Smart Data in Scanning Probe Microscopy",

abstract = "Scanning probe microscopy (SPM) techniques have opened the door to nanoscience and nanotechnology by enabling imaging and manipulation of the structure and functionality of matter at nanometer and atomic scales. Here, we analyze the scientific discovery process in SPM by following the information flow from the tip-surface junction, to knowledge adoption by the wider scientific community. We further discuss the challenges and opportunities offered by merging SPM with advanced data mining, visual analytics, and knowledge discovery technologies.",

author = "Kalinin, \{Sergei V.\} and Evgheni Strelcov and Alex Belianinov and Suhas Somnath and Vasudevan, \{Rama K.\} and Lingerfelt, \{Eric J.\} and Archibald, \{Richard K.\} and Chaomei Chen and Roger Proksch and Nouamane Laanait and Stephen Jesse",

note = "Publisher Copyright: {\textcopyright} 2016 American Chemical Society.",

year = "2016",

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doi = "10.1021/acsnano.6b04212",

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T1 - Big, Deep, and Smart Data in Scanning Probe Microscopy

AU - Kalinin, Sergei V.

AU - Strelcov, Evgheni

AU - Belianinov, Alex

AU - Somnath, Suhas

AU - Vasudevan, Rama K.

AU - Lingerfelt, Eric J.

AU - Archibald, Richard K.

AU - Chen, Chaomei

AU - Proksch, Roger

AU - Laanait, Nouamane

AU - Jesse, Stephen

PY - 2016/10/25

Y1 - 2016/10/25

N2 - Scanning probe microscopy (SPM) techniques have opened the door to nanoscience and nanotechnology by enabling imaging and manipulation of the structure and functionality of matter at nanometer and atomic scales. Here, we analyze the scientific discovery process in SPM by following the information flow from the tip-surface junction, to knowledge adoption by the wider scientific community. We further discuss the challenges and opportunities offered by merging SPM with advanced data mining, visual analytics, and knowledge discovery technologies.

AB - Scanning probe microscopy (SPM) techniques have opened the door to nanoscience and nanotechnology by enabling imaging and manipulation of the structure and functionality of matter at nanometer and atomic scales. Here, we analyze the scientific discovery process in SPM by following the information flow from the tip-surface junction, to knowledge adoption by the wider scientific community. We further discuss the challenges and opportunities offered by merging SPM with advanced data mining, visual analytics, and knowledge discovery technologies.

UR - https://www.scopus.com/pages/publications/84993999142

U2 - 10.1021/acsnano.6b04212

DO - 10.1021/acsnano.6b04212

M3 - Article

AN - SCOPUS:84993999142

SN - 1936-0851

VL - 10

SP - 9068

EP - 9086

JO - ACS Nano

JF - ACS Nano

IS - 10

ER -

Big, Deep, and Smart Data in Scanning Probe Microscopy

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