TY - GEN
T1 - Determination of First Townsend Ionization Coefficient by Simulation
AU - Crossette, N.
AU - Jenkins, T. G.
AU - Cary, J. R.
AU - Leddy, J.
AU - Smithe, D. N.
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/6
Y1 - 2019/6
N2 - In 1963, L. M. Chanin and G. D. Rork [Phys. Rev. 133, A1005 (1964)] [1] measured the first Townsend ionization coefficient for various gases and a range of pressures experimentally in a vacuum tube. A Townsend discharge is an ionization avalanche that occurs between two electrodes when secondary electron emission caused by ion impact on the cathode is negligible. The first Townsend coefficient, α, is essentially a measure of how many ionization events a single electron will cause when subject to a uniform electric field. In this study, we reproduce the experimental setup of Chanin and Rork's device in VSim [C. Nieter and J. R. Cary, J. Comp. Phys. 196, 448 (2004)] [2], a highly parallelized particle-in-cell/finite-difference time-domain code. Various particle interactions are included, and the first Townsend coefficient is calculated and compared to the reported value.
AB - In 1963, L. M. Chanin and G. D. Rork [Phys. Rev. 133, A1005 (1964)] [1] measured the first Townsend ionization coefficient for various gases and a range of pressures experimentally in a vacuum tube. A Townsend discharge is an ionization avalanche that occurs between two electrodes when secondary electron emission caused by ion impact on the cathode is negligible. The first Townsend coefficient, α, is essentially a measure of how many ionization events a single electron will cause when subject to a uniform electric field. In this study, we reproduce the experimental setup of Chanin and Rork's device in VSim [C. Nieter and J. R. Cary, J. Comp. Phys. 196, 448 (2004)] [2], a highly parallelized particle-in-cell/finite-difference time-domain code. Various particle interactions are included, and the first Townsend coefficient is calculated and compared to the reported value.
UR - https://www.scopus.com/pages/publications/85081580946
U2 - 10.1109/PPPS34859.2019.9009919
DO - 10.1109/PPPS34859.2019.9009919
M3 - Conference contribution
AN - SCOPUS:85081580946
T3 - IEEE International Pulsed Power Conference
BT - 2019 IEEE Pulsed Power and Plasma Science, PPPS 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 IEEE Pulsed Power and Plasma Science, PPPS 2019
Y2 - 23 June 2019 through 29 June 2019
ER -