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HiRES: High Resolution Extreme-Ultraviolet Spectroheliometer Toroidal Diffraction Grating Performance Evaluation

  • Thomas E. Berger
  • , Paolo Bergamini
  • , Arthur B.C. Walker
  • , J. Gethyn Timothy
  • , Surendra K. Jam
  • , Ajay K. Saxena
  • , Jagadish C. Bhattacharyya
  • , Martin C.E. Huber
  • , Giuseppe Tondello
  • , Giampiero Naletto
  • , Phillip C. Baker
  • Stanford University
  • Indian Institute of Astrophysics
  • ESTEC
  • University of Padua
  • Baker Consulting

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations

Abstract

The HiRES sounding rocket payload has been described in detail in previous SPIE Proceedings. Here, optical design of the toroidal grating spectrograph is presented and discussed. Ray tracing results are presented which outline the extreme ultraviolet (EUV) performance theoretically attainable with the HiRES instrument. Effects of optical system misalignment on the spectrograph image quality are investigated. Laboratory test results of two f/iS toroidal diffraction gratings using a 1-meter vacuum spectrograph and a Multi-Anode Microchannel Array detector are presented and discussed. The test toroidal gratings are fabricated using the elastic substrate replication technique from a ruled master grating with either a 3600 lines/mm or 1 800 lines/mm density. EUV images of 10 25gm pinholes with 250 tm center-to-center spacing taken with a hollow cathode discharge lamp are presented. Interferometric studies of toroidal figure accuracy as well as optical and electron microscopy investigations into surface quality are presented and discussed. It is found that the current toroidal gratings exhibit good imaging characteristics across a wide wavelength range but suffer from excessive EUV scatter and spectral ghosting.

Original languageEnglish
Pages (from-to)218-230
Number of pages13
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume1764
DOIs
StatePublished - Jan 22 1993
Externally publishedYes
EventUltraviolet Technology IV 1992 - San Diego, United States
Duration: Jul 22 1992 → …

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