Investigation of multiple, large area EDS detectors on an SEM capable of various mounting geometries for optimal EDS analysis

D. Edwards; N. Rowlands; D. Guarrera; N. Erdman; V. Robertson; R. McLaughlin

doi:10.1017/S1431927614004954

Investigation of multiple, large area EDS detectors on an SEM capable of various mounting geometries for optimal EDS analysis

D. Edwards
, N. Rowlands
, D. Guarrera
, N. Erdman
, V. Robertson
, R. McLaughlin

JEOL Ltd.
Oxford Instruments America Inc

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Original language	English
Pages (from-to)	646-647
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614004954
State	Published - Aug 1 2014
Externally published	Yes
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

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10.1017/S1431927614004954

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title = "Investigation of multiple, large area EDS detectors on an SEM capable of various mounting geometries for optimal EDS analysis",

author = "D. Edwards and N. Rowlands and D. Guarrera and N. Erdman and V. Robertson and R. McLaughlin",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614004954",

language = "English",

volume = "20",

pages = "646--647",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

}

TY - JOUR

T1 - Investigation of multiple, large area EDS detectors on an SEM capable of various mounting geometries for optimal EDS analysis

AU - Edwards, D.

AU - Rowlands, N.

AU - Guarrera, D.

AU - Erdman, N.

AU - Robertson, V.

AU - McLaughlin, R.

PY - 2014/8/1

Y1 - 2014/8/1

UR - https://www.scopus.com/pages/publications/84927940970

U2 - 10.1017/S1431927614004954

DO - 10.1017/S1431927614004954

M3 - Conference article

AN - SCOPUS:84927940970

SN - 1431-9276

VL - 20

SP - 646

EP - 647

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Investigation of multiple, large area EDS detectors on an SEM capable of various mounting geometries for optimal EDS analysis

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