Studies of Double-Sided, Double-Metal Silicon Microstrip Detectors

J. P. Alexander; C. J. Bebek; T. E. Browder; J. A. Dobbins; S. G. Gray; K. Honscheid; C. D. Jones; N. Katayama; J. S. Katris; P. C. Kim; M. Selen; H. M. Worden; F. Wurthwein; J. Gronberg; R. J. Morrison; D. L. Hale; C. Korte; S. Kyre; H. N. Nelson; T. K. Nelson; C. Qiao; D. M. Schmidt; D. J. Sperka; H. Tajima; D. Cinabro; S. Henderson; L. H. Miller; H. Yamamoto; M. Artuso; Z. Sobolewski; D. Akerib; M. Chadha; S. Chan; D. F. Cowen; J. S. Miller; R. Balest; J. G. Smith

doi:10.1109/NSSMIC.1992.301204

Studies of Double-Sided, Double-Metal Silicon Microstrip Detectors

J. P. Alexander
, C. J. Bebek
, T. E. Browder
, J. A. Dobbins
, S. G. Gray
, K. Honscheid
, C. D. Jones
, N. Katayama
, J. S. Katris
, P. C. Kim
, M. Selen
, H. M. Worden
, F. Wurthwein
, J. Gronberg
, R. J. Morrison
, D. L. Hale
, C. Korte
, S. Kyre
, H. N. Nelson
, T. K. Nelson

C. Qiao, D. M. Schmidt, D. J. Sperka, H. Tajima, D. Cinabro, S. Henderson, L. H. Miller, H. Yamamoto, M. Artuso, Z. Sobolewski, D. Akerib, M. Chadha, S. Chan, D. F. Cowen, J. S. Miller, R. Balest, J. G. Smith

Cornell University
University of California at Santa Barbara
Harvard
Symcuse
California Institute of Technology
U. Colorado

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We have studied double-sided, double-layer silicon microstrip detectors for the CLEO-I1 vertex detector. The double-layer structure permits the transverse strips to be connected via longitudinal readout traces to preamplifiers located at the end of the detectors. The detectors are manufactured by Hamamatsu Photonics. They are full size AC coupled detectors with polysilicon biw resistors on the n-side and punch through biasing on the pside. We present measurements of detector static properties, including the extra capacitance due to the double layer structure, as well as measurements of signal and noise.

Original language	English
Title of host publication	IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	224-226
Number of pages	3
ISBN (Electronic)	0780308840, 9780780308848
DOIs	https://doi.org/10.1109/NSSMIC.1992.301204
State	Published - 1992
Externally published	Yes
Event	1992 IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992 - Orlando, United States Duration: Oct 25 1992 → Oct 31 1992

Publication series

Name	IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992

Conference

Conference	1992 IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992
Country/Territory	United States
City	Orlando
Period	10/25/92 → 10/31/92

Access to Document

10.1109/NSSMIC.1992.301204

Cite this

Alexander, J. P., Bebek, C. J., Browder, T. E., Dobbins, J. A., Gray, S. G., Honscheid, K., Jones, C. D., Katayama, N., Katris, J. S., Kim, P. C., Selen, M., Worden, H. M., Wurthwein, F., Gronberg, J., Morrison, R. J., Hale, D. L., Korte, C., Kyre, S., Nelson, H. N., ... Smith, J. G. (1992). Studies of Double-Sided, Double-Metal Silicon Microstrip Detectors. In IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992 (pp. 224-226). (IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NSSMIC.1992.301204

@inproceedings{bd7398595a1a447e98f4cf944c174b25,

title = "Studies of Double-Sided, Double-Metal Silicon Microstrip Detectors",

abstract = "We have studied double-sided, double-layer silicon microstrip detectors for the CLEO-I1 vertex detector. The double-layer structure permits the transverse strips to be connected via longitudinal readout traces to preamplifiers located at the end of the detectors. The detectors are manufactured by Hamamatsu Photonics. They are full size AC coupled detectors with polysilicon biw resistors on the n-side and punch through biasing on the pside. We present measurements of detector static properties, including the extra capacitance due to the double layer structure, as well as measurements of signal and noise.",

author = "Alexander, \{J. P.\} and Bebek, \{C. J.\} and Browder, \{T. E.\} and Dobbins, \{J. A.\} and Gray, \{S. G.\} and K. Honscheid and Jones, \{C. D.\} and N. Katayama and Katris, \{J. S.\} and Kim, \{P. C.\} and M. Selen and Worden, \{H. M.\} and F. Wurthwein and J. Gronberg and Morrison, \{R. J.\} and Hale, \{D. L.\} and C. Korte and S. Kyre and Nelson, \{H. N.\} and Nelson, \{T. K.\} and C. Qiao and Schmidt, \{D. M.\} and Sperka, \{D. J.\} and H. Tajima and D. Cinabro and S. Henderson and Miller, \{L. H.\} and H. Yamamoto and M. Artuso and Z. Sobolewski and D. Akerib and M. Chadha and S. Chan and Cowen, \{D. F.\} and Miller, \{J. S.\} and R. Balest and Smith, \{J. G.\}",

note = "Publisher Copyright: {\textcopyright} 1993 IEEE.; 1992 IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992 ; Conference date: 25-10-1992 Through 31-10-1992",

year = "1992",

doi = "10.1109/NSSMIC.1992.301204",

language = "English",

series = "IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "224--226",

booktitle = "IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992",

address = "United States",

}

Alexander, JP, Bebek, CJ, Browder, TE, Dobbins, JA, Gray, SG, Honscheid, K, Jones, CD, Katayama, N, Katris, JS, Kim, PC, Selen, M, Worden, HM, Wurthwein, F, Gronberg, J, Morrison, RJ, Hale, DL, Korte, C, Kyre, S, Nelson, HN, Nelson, TK, Qiao, C, Schmidt, DM, Sperka, DJ, Tajima, H, Cinabro, D, Henderson, S, Miller, LH, Yamamoto, H, Artuso, M, Sobolewski, Z, Akerib, D, Chadha, M, Chan, S, Cowen, DF, Miller, JS, Balest, R & Smith, JG 1992, Studies of Double-Sided, Double-Metal Silicon Microstrip Detectors. in IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992. IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992, Institute of Electrical and Electronics Engineers Inc., pp. 224-226, 1992 IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992, Orlando, United States, 10/25/92. https://doi.org/10.1109/NSSMIC.1992.301204

Studies of Double-Sided, Double-Metal Silicon Microstrip Detectors. / Alexander, J. P.; Bebek, C. J.; Browder, T. E. et al.
IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992. Institute of Electrical and Electronics Engineers Inc., 1992. p. 224-226 (IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Studies of Double-Sided, Double-Metal Silicon Microstrip Detectors

AU - Alexander, J. P.

AU - Bebek, C. J.

AU - Browder, T. E.

AU - Dobbins, J. A.

AU - Gray, S. G.

AU - Honscheid, K.

AU - Jones, C. D.

AU - Katayama, N.

AU - Katris, J. S.

AU - Kim, P. C.

AU - Selen, M.

AU - Worden, H. M.

AU - Wurthwein, F.

AU - Gronberg, J.

AU - Morrison, R. J.

AU - Hale, D. L.

AU - Korte, C.

AU - Kyre, S.

AU - Nelson, H. N.

AU - Nelson, T. K.

AU - Qiao, C.

AU - Schmidt, D. M.

AU - Sperka, D. J.

AU - Tajima, H.

AU - Cinabro, D.

AU - Henderson, S.

AU - Miller, L. H.

AU - Yamamoto, H.

AU - Artuso, M.

AU - Sobolewski, Z.

AU - Akerib, D.

AU - Chadha, M.

AU - Chan, S.

AU - Cowen, D. F.

AU - Miller, J. S.

AU - Balest, R.

AU - Smith, J. G.

PY - 1992

Y1 - 1992

N2 - We have studied double-sided, double-layer silicon microstrip detectors for the CLEO-I1 vertex detector. The double-layer structure permits the transverse strips to be connected via longitudinal readout traces to preamplifiers located at the end of the detectors. The detectors are manufactured by Hamamatsu Photonics. They are full size AC coupled detectors with polysilicon biw resistors on the n-side and punch through biasing on the pside. We present measurements of detector static properties, including the extra capacitance due to the double layer structure, as well as measurements of signal and noise.

AB - We have studied double-sided, double-layer silicon microstrip detectors for the CLEO-I1 vertex detector. The double-layer structure permits the transverse strips to be connected via longitudinal readout traces to preamplifiers located at the end of the detectors. The detectors are manufactured by Hamamatsu Photonics. They are full size AC coupled detectors with polysilicon biw resistors on the n-side and punch through biasing on the pside. We present measurements of detector static properties, including the extra capacitance due to the double layer structure, as well as measurements of signal and noise.

UR - https://www.scopus.com/pages/publications/105044609865

U2 - 10.1109/NSSMIC.1992.301204

DO - 10.1109/NSSMIC.1992.301204

M3 - Conference contribution

AN - SCOPUS:105044609865

T3 - IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992

SP - 224

EP - 226

BT - IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 1992 IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992

Y2 - 25 October 1992 through 31 October 1992

ER -

Alexander JP, Bebek CJ, Browder TE, Dobbins JA, Gray SG, Honscheid K et al. Studies of Double-Sided, Double-Metal Silicon Microstrip Detectors. In IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992. Institute of Electrical and Electronics Engineers Inc. 1992. p. 224-226. (IEEE Conference on Nuclear Science Symposium and Medical Imaging, NSS/MIC 1992). doi: 10.1109/NSSMIC.1992.301204

Studies of Double-Sided, Double-Metal Silicon Microstrip Detectors

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