The constellation-X RGS options: Raytrace modeling of the off-plane gratings

  • K. A. Flanagan
  • , J. E. Davis
  • , R. K. Heilmann
  • , A. M. Levine
  • , M. McGuirk
  • , G. R. Ricker
  • , M. L. Schattenburg
  • , M. Wise
  • , A. Rasmussen
  • , J. Bookbinder
  • , M. Freeman
  • , T. Gaetz
  • , D. Jerius
  • , D. Nguyen
  • , W. Podgorski
  • , P. Reid
  • , W. Cash
  • , A. Shipley
  • , D. Gallagher
  • , P. Huang
  • S. Jordan

Research output: Contribution to journalConference articlepeer-review

10 Scopus citations

Abstract

The Reflection Grating Spectrometer of the Constellation-X mission has two strong candidate configurations. The first configuration, the in-plane grating (IPG), is a set of reflection gratings similar to those flown on XMM-Newton and has grooves perpendicular to the direction of incident light. In the second configuration, the off-plane grating (OPG), the grooves are closer to being parallel to the incident light, and diffract along a cone. It has advantages of higher packing density, and higher reflectivity. Confinement of these gratings to sub-apertures of the optic allow high spectral resolution. We have developed a raytrace model and analysis technique for the off-plane grating configuration. Initial estimates indicate that first order resolving powers in excess of 1000 (defined with half-energy width) are achievable for sufficiently long wavelengths (λ ≥ 12Å), provided separate accommodation is made for gratings in the subaperture region farther from the zeroth order location.

Original languageEnglish
Pages (from-to)515-529
Number of pages15
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5488
Issue numberPART 2
DOIs
StatePublished - 2004
EventUV and Gamma-Ray Space Telescope Systems - Glasgow, United Kingdom
Duration: Jun 21 2004Jun 24 2004

Keywords

  • CCD
  • Diffraction
  • High resolution
  • Off-plane grating
  • Reflection gratings
  • Spectrometer
  • X-ray

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