Using radio occultation-based electron density profiles for studying sporadic E layer spatial and temporal characteristics

Haifeng Liu; Xiaohua Xu; Jia Luo; Tianyang Hu

doi:10.1186/s40623-024-02038-z

Using radio occultation-based electron density profiles for studying sporadic E layer spatial and temporal characteristics

Haifeng Liu, Xiaohua Xu, Jia Luo, Tianyang Hu

Geospace Frontiers

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Original language	English
Article number	93
Journal	Earth Planets and Space
Volume	76
DOIs	https://doi.org/10.1186/s40623-024-02038-z
State	Published - Jul 10 2024

Keywords

Electron density
Es intensity
Es thickness
Occurrence rate
Sporadic-E layer

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title = "Using radio occultation-based electron density profiles for studying sporadic E layer spatial and temporal characteristics",

keywords = "Electron density, Es intensity, Es thickness, Occurrence rate, Sporadic-E layer",

author = "Haifeng Liu and Xiaohua Xu and Jia Luo and Tianyang Hu",

year = "2024",

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doi = "10.1186/s40623-024-02038-z",

language = "English",

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journal = "Earth Planets and Space",

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T1 - Using radio occultation-based electron density profiles for studying sporadic E layer spatial and temporal characteristics

AU - Liu, Haifeng

AU - Xu, Xiaohua

AU - Luo, Jia

AU - Hu, Tianyang

PY - 2024/7/10

Y1 - 2024/7/10

KW - Electron density

KW - Es intensity

KW - Es thickness

KW - Occurrence rate

KW - Sporadic-E layer

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DO - 10.1186/s40623-024-02038-z

M3 - Article

VL - 76

JO - Earth Planets and Space

JF - Earth Planets and Space

M1 - 93

ER -

Using radio occultation-based electron density profiles for studying sporadic E layer spatial and temporal characteristics

Keywords

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